The IEEE AP/ED/MTT North Italy Chapter is pleased to announce the IEEE T-MTT Special Issue on “Emerging RF Measurement Techniques and Applications” (Guest Editors: Dr. Leonard Hayden, Prof. Changzhi Li, Prof. Patrick Roblin)

Submission due date is May 1, 2016. This special issueis scheduled for publication in November 2016. Click the Call for Papers for more details.